Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM
نویسندگان
چکیده
منابع مشابه
Calculation of integrated intensities in aberration-corrected Z-contrast images.
Inclusion of spatial incoherence has been shown to give quantitative agreement between non-aberration-corrected high-angle annular dark-field scanning transmission electron microscopy images and theoretical simulations. Here we show that, using the same approach, a significant improvement in the correlation between calculated and experimental normalized integrated intensities is obtained in the...
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In a scanning transmission electron microscope (STEM), the elemental analysis at atomic resolution is realized by the combination with electron energy-loss spectroscopy (EELS), since an aberration corrected probe forming lens system enables us to obtain an electron probe sized about 0.1 nm [1]. In EELS, the energy resolution is mainly limited by the energy spread of the electron source, which i...
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Examining small particles embedded in a specimen foil is a challenging application for analytical STEM methods. When the particles are ~2 nm or smaller and the foils must be prepared by FIB (which results in thicker foils and more surface damage), the challenges increase. Here we report the use of aberrationcorrected STEM, equipped with high-detection-efficiency EDS systems, and multivariate st...
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Iron-rhodium (FeRh) nanoislands of equiatomic composition have been analysed using scanning transmission electron microscopy (STEM) electron energy loss spectroscopy(EELS) and high angle annular dark field (HAADF) techniques. Previous magnetometry results have lead to a hypothesis that at room temperature the core of the islands are antiferromagnetic while the shell has a small ferromagnetic si...
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In the past 15 years, the advent of aberration correction technology in electron microscopy has enabled materials analysis on the atomic scale. This is made possible by precise arrangements of multipole electrodes and magnetic solenoids to compensate the aberrations inherent to any focusing element of an electron microscope. Here, we describe an alternative method to correct for the spherical a...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2009
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927609095415